Ellipsometry on magnetooptic thin film multilayer systems-Reference-Cited by-同舟云学术

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Ellipsometry on magnetooptic thin film multilayer systems

Published:1984-07 Issue:3 Volume:34 Page:139-143
ISSN:0721-7269
Container-title:Applied Physics B Photophysics and Laser Chemistry
language:en
Short-container-title:Appl. Phys. B

Author:

Kranz J.,Schr�dter Ch.

Publisher

Springer Science and Business Media LLC

Subject

General Engineering,General Physics and Astronomy,Physics and Astronomy (miscellaneous)

Link

http://link.springer.com/content/pdf/10.1007/BF00697506.pdf

Reference9 articles.

1. J. Kranz, A. Hubert: Z. Angew. Phys.15, 220 (1963)

2. D. Keay, P.H. Lissberger: Opt. Acta15, 373 (1968)

3. J. Kranz, H. Stremme: IEEE Trans. MAG-5, 453 (1969)

4. S. Tolansky:Multiple Beam Interference Microscopy of Metals (Academic Press, London 1970)

5. R.M.A. Azzam, N.M. Bashara:Ellipsometry and Polarized Light (North-Holland, Amsterdam 1979) p. 386

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Landau Level Spectroscopy: Interband Effects and Faraday Rotation;Landau Level Spectroscopy;1991

2. Use of the 4 × 4 matrix method in the optics of multilayer magnetooptic recording media;Applied Optics;1988-04-01

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