Separating Reflection Components of Textured Surfaces using a Single Image

Author:

Tan Robby T.,Ikeuchi Katsushi

Publisher

Springer US

Reference32 articles.

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4. A. Criminisi, S.B. Kang, R. Swaminathan, S. Szeliski, and P. Anandan. Extracting layers and analysis their specular properties using epipolar plane image analysis. Microsoft Research Technical Report MSR-TR-2002-19, 2002.

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