1. Bardell, P.H., McAnney, W. H., and Savir, J., Built-In Test For VLSI: Pseudorandom Techniques, John Wiley & Sons, 1982.
2. Konemann, B., Mucha, J., and Zwieholf, G., Built-In Test for Complex Digital Integrated Circuits, IEEE J. Solid State Circuits, Vol SC-15, pp. 315–318, June 1980.
3. Karpovsky, M. G., Finite Orthogonal Series in the Design of Digital Devices, John Wiley & Sons, 1976.
4. Karpovsky, M. G., (Editor), Spectral Techniques and Fault Detection, Academic Press, 1985.
5. Mac Williams, F. J., Sloane, N. J. A., The Theory of Error Correcting Codes, North Holland, 1978.