A Simple and Effective Framework for Pairwise Deep Metric Learning-Reference-Cited by-同舟云学术

A Simple and Effective Framework for Pairwise Deep Metric Learning

Published:2020 Issue: Volume: Page:375-391
ISSN:0302-9743
Container-title:Computer Vision – ECCV 2020
language:
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Author:

Qi Qi,Yan Yan,Wu Zixuan,Wang Xiaoyu,Yang Tianbao

Publisher

Springer International Publishing

Link

https://link.springer.com/content/pdf/10.1007/978-3-030-58583-9_23

Reference28 articles.

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2. Fan, Y., Lyu, S., Ying, Y., Hu, B.: Learning with average top-k loss. In: Advances in Neural Information Processing Systems, pp. 497–505 (2017)

3. Lecture Notes in Computer Science;W Ge,2018

4. Hadsell, R., Chopra, S., LeCun, Y.: Dimensionality reduction by learning an invariant mapping. In: 2006 IEEE Computer Society Conference on Computer Vision and Pattern Recognition (CVPR 2006), vol. 2, pp. 1735–1742. IEEE (2006)

5. Harwood, B., Kumar, B., Carneiro, G., Reid, I., Drummond, T., et al.: Smart mining for deep metric learning. In: Proceedings of the IEEE International Conference on Computer Vision, pp. 2821–2829 (2017)

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