Author:
Chen Tian,Zuo Yongsheng,An Xin,Ren Fuji
Publisher
Springer International Publishing
Reference15 articles.
1. S. Mirthulla, A. Arulmurugan, Improvement of test data compression using combined encoding, in International Conference on Electronics and Communication Systems (ICECS) (2015), pp. 635–638
2. S. Seo, Y. Lee, S. Kang, Tri-state coding using reconfiguration of twisted ring counter for test data compression. IEEE Trans. Comput.-Aided Des. Integr. Circ. Syst. 35(2), 274–284 (2016)
3. J. Nicolai, Integrated circuit with mode detection pin for tristate level detection, U.S. Patent 5198707 (1993)
4. D. Thomson, P. Sheridan, J. Cleary, Tri-state input detection circuit. U.S. Patent: 6133753 (2000)
5. C.A. Chen, S.K. Gupta, Efficient BIST TPG design and test cube compaction via input reduction. IEEE Trans. Comput.-Aided Des. Integr. Circ. Syst. 17(8), 692–705 (2002)