Quartz Sensors in Atomic Force Microscopy
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Publisher
Springer International Publishing
Link
http://link.springer.com/content/pdf/10.1007/978-3-030-13654-3_18
Reference4 articles.
1. S. Morita, F.J. Giessibl, R. Wiesendanger (eds.), Non-contact Atomic Force Microscopy, vol. 2 (Springer, Heidelberg, 2009). https://doi.org/10.1007/978-3-642-01495-6
2. I. Morawski, B. Voigtländer, Simultaneously measured signals in scanning probe microscopy with a needle sensor: frequency shift and tunneling current. Rev. Sci. Instrum. 81, 033703 (2010). https://doi.org/10.1063/1.3321437
3. F.J. Giessibl, F. Pielmeier, T. Eguchi, T. An, Y. Hasegawa, Comparison of force sensors for atomic force microscopy based on quartz tuning forks and length-extensional resonators. Phys. Rev. B 84, 125409 (2011). https://doi.org/10.1103/PhysRevB.84.125409
4. G.H. Simon, M. Heyde, H.-P. Rust, Recipes for cantilever parameter determination in dynamic force spectroscopy: spring constant and amplitude. Nanotechnology 18, 255503 (2007). https://doi.org/10.1088/0957-4484/18/25/255503
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