Author:
Won Yoo-Seung,Bhasin Shivam
Publisher
Springer International Publishing
Reference15 articles.
1. Benadjila, R., Prouff, E., Strullu, R., Cagli, E., Dumas, C.: Deep learning for side-channel analysis and introduction to ASCAD database. J. Cryptographic Eng. 10(2), 163–188 (2019). https://doi.org/10.1007/s13389-019-00220-8
2. Bhasin, S., Danger, J.L., Guilley, S., Najm, Z.: NICV: normalized inter-class variance for detection of side-channel leakage. In: 2014 International Symposium on Electromagnetic Compatibility, Tokyo, pp. 310–313. IEEE (2014)
3. Bhasin, S., Guilley, S., Heuser, A., Danger, J.-L.: From cryptography to hardware: analyzing and protecting embedded Xilinx BRAM for cryptographic applications. J. Cryptographic Eng. 3(4), 213–225 (2013). https://doi.org/10.1007/s13389-013-0048-4
4. Lecture Notes in Computer Science;E Brier,2004
5. Lecture Notes in Computer Science;E Cagli,2017
Cited by
3 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献