Key-Components for Ultra-low DC Power Gallium Nitride Low-Noise Receivers
Author:
Publisher
Springer Nature Switzerland
Link
https://link.springer.com/content/pdf/10.1007/978-3-031-48711-8_15
Reference26 articles.
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2. Bosi, G., Raffo, A., Vadalà, V., Giofrè, R., Crupi, G., Vannini, G.: A thorough evaluation of GaN HEMT degradation under realistic power amplifier operation. Electronics 12(13), 2939 (2023). https://doi.org/10.3390/electronics12132939. https://www.mdpi.com/2079-9292/12/13/2939
3. Colangeli, S., Longhi, P.E., Ciccognani, W., Limiti, E.: On the optimum noise-gain locus of two-ports. IEEE Trans. Microw. Theory Techn. 67(6), 2284–2290 (2019). https://doi.org/10.1109/TMTT.2019.2910066
4. Crupi, G., et al.: A comprehensive overview of the temperature-dependent modeling of the high-power GaN HEMT technology using mm-wave scattering parameter measurements. Electronics 12(8), 1771 (2023). https://doi.org/10.3390/electronics12081771. https://www.mdpi.com/2079-9292/12/8/1771
5. Dambrine, G., Cappy, A., Heliodore, F., Playez, E.: A new method for determining the FET small-signal equivalent circuit. IEEE Trans. Microw. Theory Techn. 36(7), 1151–1159 (1988). https://doi.org/10.1109/22.3650. http://ieeexplore.ieee.org/document/3650/
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