Introduction to Wearout
Author:
Publisher
Springer International Publishing
Link
http://link.springer.com/content/pdf/10.1007/978-3-030-20051-0_1
Reference51 articles.
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2. Jeonghee Shin, Victor Zyuban, Pradip Bose, and Timothy M Pinkston. A proactive wearout recovery approach for exploiting microarchitectural redundancy to extend cache sram lifetime. In ACM SIGARCH Computer Architecture News, volume 36, pages 353–362. IEEE Computer Society, 2008.
3. Robert Baumann. Soft errors in advanced computer systems. IEEE Design & Test of Computers, 22(3):258–266, 2005.
4. ITRS Report. http://www.itrs2.net/itrs-reports.html .
5. James H Stathis, M Wang, RG Southwick, EY Wu, BP Linder, EG Liniger, G Bonilla, and H Kothari. Reliability challenges for the 10nm node and beyond. In Electron Devices Meeting (IEDM), 2014 IEEE International, pages 20–6. IEEE, 2014.
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