High-resolution analytical electron microscopy of catalytically etched silicon nanowires
Author:
Publisher
Springer Science and Business Media LLC
Subject
General Materials Science,General Chemistry
Link
http://link.springer.com/content/pdf/10.1007/s00339-009-5101-x.pdf
Reference8 articles.
1. R.S. Wagner, W.C. Ellis, Appl. Phys. Lett. 4, 89 (1964)
2. B. Fuhrmann, H.S. Leipner, H.-R. Höche, L. Schubert, U. Gösele, Nano. Lett. 5, 2524 (2005)
3. Z. Huang, H. Fang, J. Zhu, Adv. Mater. 19, 744 (2007)
4. K. Peng, J. Hu, Y. Yan, Y. Wu, H. Fang, Y. Xu, S.T. Lees, J. Zhu, Adv. Funct. Mater. 16, 387 (2006)
5. X. Li, W. Bohn, Appl. Phys. Lett. 77, 2572 (2000)
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