In Situ TEM Scratch Testing of Perpendicular Magnetic Recording Multilayers with a Novel MEMS Tribometer-Reference-Cited by-同舟云学术

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In Situ TEM Scratch Testing of Perpendicular Magnetic Recording Multilayers with a Novel MEMS Tribometer

Published:2016-10-24 Issue:1 Volume:69 Page:51-56
ISSN:1047-4838
Container-title:JOM
language:en
Short-container-title:JOM

Author:

Hintsala Eric D.,Stauffer Douglas D.,Oh Yunje,Asif S. A. Syed

Publisher

Springer Science and Business Media LLC

Subject

General Engineering,General Materials Science

Link

http://link.springer.com/content/pdf/10.1007/s11837-016-2154-0.pdf

Reference27 articles.

1. Z.W. Shan, G. Adesso, A. Cabot, M.P. Sherburne, S.A.S. Asif, O.L. Warren, D.C. Chrzan, A.M. Minor, and A.P. Alivisatos, Nat. Mater. 7, 947 (2008).

2. C.E. Carlton and P.J. Ferreira, Micron 43, 1134 (2012).

3. I. Issa, J. Amodeo, J. Réthoré, L. Joly-Pottuz, C. Esnouf, J. Morthomas, M. Perez, J. Chevalier, and K. Masenelli-Varlot, Acta Mater. 86, 295 (2015).

4. A.J. Wagner, E.D. Hintsala, P. Kumar, W.W. Gerberich, and K.A. Mkhoyan, Acta Mater. 100, 256 (2015).

5. Y. Lu, J. Song, J.Y. Huang, and J. Lou, Adv. Funct. Mater. 21, 3982 (2011).

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