1. "[1] Băjenescu, T. I., "Excess noise and reliability," Proceedings of RELECTRONIC '85, Budapest (Hungary), 1985, pp. 260-266.
2. [2] Jaeger, R. C., Brodersen, A. J., "Low frequency noise sources in bipolar junction transistors," IEEE Trans. on Electron Devices, ED-17, no. 2, p. 128.
3. [3] Martin, J. C. et al., "Le bruit en créneaux des transistors plans au silicium," Electronics Letters, June 1966, vol. 2, no. 6, pp. 228-230.
4. [4] "Le bruit en créneaux des transistors bipolaires," Colloques Internationaux du C.N.R.S. no. 204(1971), pp. 59-75.
5. [5] "Corrélation entre la fiabilité des transistors bipolaires au silicium et leur bruit de fond en excès," Actes du Colloque Internat. sur les Composants Electroniques de Haute Fiabilité, Toulouse, 1972, pp. 105-119.